عنوان
پدید آورنده
موضوع
رده
TK 7895 .M4 I334 1994
TK
7895
.
M4
I334
1994
کتابخانه
محل استقرار
O
IEEE International Workshop on Memory Technology, Design, and Testing )1994 : San Jose, Calif.(
Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
Los Alamitos, Calif.
IEEE Computer Society Press
1994
ix, 141 p. : ill
Includes bibliographical references and index
Semiconductor storage devices - Testing - Congresses
Random access memory - Congresses
TK
7895
.
M4
I334
1994
AU
edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI
English
