عنوان
پدید آورنده
موضوع
رده
TK 7874 .I3233 1993
TK
7874
.
I3233
1993
کتابخانه
محل استقرار
E1
ICMTS 93 : proceedings of the 1993 International Conference on Microelectronic Test Structures: March 22-25, 1993, Sitges, Barcelona, Spain
New York
Institute of Electrical and Electronics Engineers
]199?[
xv, 297 p. : ill
94CH3220-1
Includes bibliographical references and index
Integrated circuits - Testing - Congresses
Semiconductors - Testing - Congresses
Transistors - Testing - Congresses
TK
7874
.
I3233
1993
AU
sponsored by the IEEE Electron Devices Society
IEEE International Conference on Microelectronic Test Structures )1993 : Barcelona, Spain(
English
