عنوان
پدید آورنده
موضوع
رده
TK 7874 .A23
TK
7874
.
A23
کتابخانه
محل استقرار
CE E1 O1 R1
Abramovici, Miron.
Digital systems testing and testable design
New York, NY
IEEE Press
1990
xxi, 653 p. : ill
Electrical engineering, communications, and signal processing
Includes bibliographical references )p. 644-645( and index
Digital integrated circuits - Testing
Digital integrated circuits - Design and construction
TK
7874
.
A23
AU
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
English
