عنوان
پدید آورنده
موضوع
رده
TK 7874 .S533
TK
7874
.
S533
کتابخانه
محل استقرار
CE
Singh, Narinder
An artificial intelligence approach to test generation
Boston
Kluwer Academic Publishers
1987
x, 193 p. : ill
The Kluwer international series in engineering and computer science, SECS 19
Includes bibliographical references )p. ]189[-193(
Integrated circuits - Very large scale integration - Testing - Data processing
Expert systems )Computer science(
Artificial intelligence
TK
7874
.
S533
AU
1956-
by Narinder Singh
English
