عنوان
پدید آورنده
موضوع
رده
TK 7874 .J34
TK
7874
.
J34
کتابخانه
محل استقرار
E1
Jakubowski, Andrzej
Diagnostic measurements in LSI/VLSI integrated circuits production
Singapore
World Scientific
1991
xv,356 p. : ill
Advanced series in electrical and computer engineering, Vol. 7
Includes bibliographies
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Very large scale integration - Testing
TK
7874
.
J34
AU
Andrzej Jakubowski, Wieslaw Marciniak, Henryk M. Przewlocki
English
Book
