عنوان

VLSI test principles and architectures :

پدید آورنده

edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

موضوع

Integrated circuits-- Very large scale integration-- Design.,Integrated circuits-- Very large scale integration-- Testing.,Circuits intégrés à très grande échelle-- Conception et construction.,Circuits intégrés à très grande échelle-- Essais.,Circuitos integrados vlsi.,COMPUTERS-- Logic Design.,Integrated circuits-- Very large scale integration-- Design.,Integrated circuits-- Very large scale integration-- Design.,Integrated circuits-- Very large scale integration-- Testing.,Integrated circuits-- Very large scale integration-- Testing.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- Logic.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- VLSI & ULSI.,Testen,VLSI

رده

TK7874
.
75
.
V587

2006eb

کتابخانه

کتابخانه مطالعات اسلامی به زبان های اروپایی

محل استقرار

استان: قم ـ شهر: قم

تماس با کتابخانه : 32910706-025

0080474799

9780080474793

0123705975

9780123705976

b717549

VLSI test principles and architectures :

[Book]

design for testability /

edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

Boston :

Elsevier Morgan Kaufmann Publishers,

1 online resource (xxx, 777 pages) :

illustrations

The Morgan Kaufmann series in systems on silicon

Includes bibliographical references and index.

Design for testability / Laung-Terng (L.-T.) Wang, Xiaoqing Wen, and Khader S. Abdel-Hafez -- Logic and fault simulation / Jiun-Lang Huang, James C.-M. Li, and Duncan M. (Hank) Walker -- Test generation / Michael S. Hsiao -- Logic built-in self-test / Laung-Terng (L.-T.) Wang -- Test compression / Xiaowei Li, Kuen-Jong Lee, and Nur A. Touba -- Logic diagnosis / Shi-Yu Huang -- Memory testing and built-in self-test / Cheng-Wen Wu -- Memory diagnosis and built-in self-repair / Cheng-Wen Wu -- Boundary scan and core-based testing / Kuen-Jong Lee -- Analog and mixed-signal testing / Chauchin Su -- Test technology trends in the nanometer age / Kwang-Ting (Tim) Cheng, Wen-Ben Jone, and Laung-Terng (L.-T.) Wang.

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Elsevier Science & Technology

132281:132389

VLSI test principles and architectures.

9780123705976

Integrated circuits-- Very large scale integration-- Design.

Integrated circuits-- Very large scale integration-- Testing.

Circuits intégrés à très grande échelle-- Conception et construction.

Circuits intégrés à très grande échelle-- Essais.

Circuitos integrados vlsi.

COMPUTERS-- Logic Design.

Integrated circuits-- Very large scale integration-- Design.

Integrated circuits-- Very large scale integration-- Testing.

TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- Logic.

TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- VLSI & ULSI.

Testen

VLSI

COM-- 036000

TEC-- 008030

TEC-- 008050

621

39/5

TK7874

V587

2006eb

4030

4950

4952

rvk

Wang, Laung-Terng

Wen, Xiaoqing

Wu, Cheng-Wen,EE Ph. D.

20201208095225.0

[Book]

عنوان VLSI test principles and architectures :

پدید آورنده edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

رده TK7874.75 .V587 2006eb

کتابخانه کتابخانه مطالعات اسلامی به زبان های اروپایی

محل استقرار استان: قم ـ شهر: قم

عنوان

VLSI test principles and architectures :

پدید آورنده

edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

رده

TK7874
.
75
.
V587

2006eb

کتابخانه

کتابخانه مطالعات اسلامی به زبان های اروپایی

محل استقرار

استان: قم ـ شهر: قم