عنوان

Spectroscopic ellipsometry for photovoltaics.

3319753754

3319753762

3319753770

9783319753751

9783319753768

9783319753775

9783319753751

Spectroscopic ellipsometry for photovoltaics.

[Book]

Hiroyuki Fujiwara, Robert W. Collins, editors.

Volume 1,dollar5Fundamental principles and solar cell characterization /

Cham, Switzerland :

Springer,

2018.

1 online resource (xx, 594 pages) :

illustrations (some color)

Springer series in optical sciences,

volume 212

0342-4111 ;

Includes bibliographical references and index.

Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In, Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S, Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.

0

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Springer Nature

com.springer.onix.9783319753775

9783319753751

9783319753768

Fundamental principles and solar cell characterization

Ellipsometry.

Photovoltaic power generation.

Ellipsometry.

Photovoltaic power generation.

PHJ

TEC019000

TTB

TTBL

Collins, Robert W.

Fujiwara, Hiroyuki

20200823105851.0

pn

[Book]

Y