عنوان
پدید آورنده
موضوع
رده
TA404.6
TA404
.
6
کتابخانه
محل استقرار
1493966766
9781493966769
b623762
Scanning Electron Microscopy and X-Ray Microanalysis /
[Book]
by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
4th ed. 2018.
1 Online-Ressource (XXIII, 550 p. 546 illus., 409 illus. in color)
978-1-4939-6674-5
Materials science.
Measurement.
Microscopy.
Physical measurements.
Spectrum analysis.
Biological Microscopy.
Characterization and Evaluation of Materials.
Materials science.
Materials Science.
Measurement Science and Instrumentation.
Measurement.
Microscopy.
Physical measurements.
Spectroscopy and Microscopy.
Spectroscopy.
Spectroscopy/Spectrometry.
Materials science.
Measurement.
Microscopy.
Physical measurements.
Spectrum analysis.
620
.
11
23
TA404
.
6
Goldstein, Joseph I.
Joy, David C.
Michael, Joseph R.
Newbury, Dale E.
Ritchie, Nicholas W.M.
Scott, John Henry J.
20200617082856.0
rda
مطالعه متن کتاب [Book]
Y
