عنوان

Transmission Electron Microscopy :

1475725191

9781475725193

030645324X

1475725191

9780306453243

b623723

Transmission Electron Microscopy :

[Book]

a Textbook for Materials Science /

by David B. Williams, C. Barry Carter.

Boston, MA :

Springer US,

1996.

1 online resource (xxix, 729 pages)

1 The Transmission Electron Microscope -- 2 Scattering and Diffraction -- 3 Elastic Scattering -- 4 Inelastic Scattering and Beam Damage -- 5 Electron Sources -- 6 Lenses, Apertures, and Resolution -- 7 How to "See" Electrons -- 8 Pumps and Holders -- 9 The Instrument -- 10 Specimen Preparation -- 11 Diffraction Patterns -- 12 Thinking in Reciprocal Space -- 13 Diffracted Beams -- 14 Bloch Waves -- 15 Dispersion Surfaces -- 16 Diffraction from Crystals -- 17 Diffraction from Small Volumes -- 18 Indexing Diffraction Patterns -- 19 Kikuchi Diffraction -- 20 Obtaining CBED Patterns -- 21 Using Convergent-Beam Techniques -- 22 Imaging in the TEM -- 23 Thickness and Bending Effects -- 24 Planar Defects -- 25 Strain Fields -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image Simulation -- 30 Quantifying and Processing HRTEM Images -- 31 Other Imaging Techniques -- 32 X-ray Spectrometry -- 33 The XEDS-TEM Interface -- 34 Qualitative X-ray Analysis -- 35 Quantitative X-ray Microanalysis -- 36 Spatial Resolution and Minimum Detectability -- 37 Electron Energy-Loss Spectrometers -- 38 The Energy-Loss Spectrum -- 39 Microanalysis with Ionization-Loss Electrons -- 40 Everything Else in the Spectrum -- Acknowledgements for Figures.

0

This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

9780306453243

Microscopy.

Surfaces (Physics)

Microscopy.

Surfaces (Physics)

TEC021000

TGMT

Williams, David B.

Carter, C. Barry.

20200617082832.0

pn

[Book]

Y