عنوان
پدید آورنده
موضوع
رده
TA169.3 .L88 2004
TA169
.
3
.
L88
2004
کتابخانه
محل استقرار
1584884711 (alk. paper)
b517578
Design and analysis of accelerated tests for mission critical reliability /
[Book]
Michael J. LuValle, Bruce G. Lefevre, SriRaman Kannan
Boca Raton, Fla. :
Chapman & Hall/CRC,
c2004
236 p. :
ill. ;
25 cm
Includes bibliographical references (p. 227-229) and index
Accelerated life testing
Reliability (Engineering)
620/
.
00452
22
TA169
.
3
.
L88
2004
LuValle, Michael J
Kannan, SriRaman
Lefevre, Bruce G
20040707132159.0
مطالعه متن کتاب [Book]
Y
