عنوان
پدید آورنده
موضوع
رده
TK7871.99.M44
TK7871
.
99
.
M44
کتابخانه
محل استقرار
1461479088
1461479096
9781461479086
9781461479093
9781461479086
dltt
Bias temperature instability for devices and circuits
[Book]
Tibor Grasser, editor
New York :
Springer,
2014
1 online resource (805 pages)
Includes bibliographical references
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime
Bias Temperature Instability for Devices and Circuits.
9781461479086
Metal oxide semiconductor field-effect transistors
TK7871
.
99
.
M44
Grasser, Tibor
Ohio Library and Information Network
20210107074157.0
pn
مطالعه متن کتاب [Book]
270410
Y
