عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
0871708639
9780871708632
dltt
ISTFA 2007 :
[Book]
proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International
Materials Park, Ohio :
ASM International,
c2007
xvi, 356 p. :
ill. :
28 cm. +
1 CD-ROM
Includes bibliographical references and index
Thirty-third International Symposium for Testing and Failure Analysis
33rd International Symposium for Testing and Failure Analysis
Proceedings of the 33rd International Symposium for Testing and Failure Analysis
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
International Symposium for Testing and Failure Analysis(33rd :2007 :, San Jose, Calif.)
ASM International
Electronic Device Failure Analysis Society
20080416144428.0
مطالعه متن کتاب [Book]
Y
