conference proceedings of the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International
Materials Park, Ohio :
ASM International,
2008
xx, 528 p. :
ill. ;
28 cm. +
1 CD-ROM (4 3/4 in.)
Includes bibliographical references and index
International Symposium for Testing and Failure Analysis 2008
Thirty-fourth International Symposium for Testing and Failure Analysis
34th International Symposium for Testing and Failure Analysis
Proceedings of the 34th International Symposium for Testing and Failure Analysis
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
International Symposium for Testing and Failure Analysis(34th :2008 :, Portland, Oregon.)