عنوان
پدید آورنده
موضوع
رده
QD96.S43 .M34 2013
QD96
.
S43
.
M34
2013
کتابخانه
محل استقرار
1118589254 (electronic bk.)
1118589335 (electronic bk.)
9781118589250 (electronic bk.)
9781118589335 (electronic bk.)
1118589254
9780470886052
dltt
Cluster secondary ion mass spectrometry :
[Book]
principles and applications /
edited by Christine M. Mahoney.
1 online resource (350 pages).
Wiley series on mass spectrometry
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods
Cluster secondary ion mass spectrometry.
0470886056
Secondary ion mass spectrometry.
Secondary electron emission.
Secondary ion mass spectrometry.
Surfaces (Physics)
SCI-- 013010
543
.
65
QD96
.
S43
.
M34
2013
Mahoney, Christine M.,1975-
Ohio Library and Information Network.
Wiley Online Library (Online service)
20130608155128.0
rda
مطالعه متن کتاب [Book]
Y
