عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
0387333258 (cased)
9780387333250 (cased)
dltt
Scanning microscopy for nanotechnology
[Book]
techniques and applications /
edited by Weilie Zhou and Zhong Lin Wang.
London :
Springer,
2007.
xiv, 522 p., [12] p. of plates :
ill. (some col.) ;
24 cm.
Includes bibliographical references and index.
Fundamentals of scanning electron microscopy / Weilie Zhou ... [et al.] -- Backscattering detector and EBSD in nanomaterials characterization / Tim Maitland and Scott Sitzman -- X-ray microanalysis in nanomaterials / Robert Anderhalt -- Low kW scanning electron microscopy / M. David Frey -- E-beam nanolithography integrated with scanning electron microscope / Joe Nabity ... [et al.] -- Scanning transmission electron microscopy for nanostructure characterization / S.J. Pennycook ... [et al.] -- Introduction to in-situ nanomanipulation for nanomaterials engineering / Rishi Gupta and Richard E. Stallcup, II -- Applications of FIB and DualBeam for nanofabrication / Brandon Van Leer, Lucille A. Giannuzzi, and Paul Anzalone -- Nanowires and carbon nanotubes / Jianye Li and Jie Liu -- Photonic crystals and devices / Xudong Wang and Zhong Lin Wang -- Nanoparticles and colloidal self-assembly / Gabriel Caruntu, Daniela Caruntu, and Charles J. O'Connor -- Nano-building blocks fabricated through templates / Feng Li and John B. Wiley -- One-dimensional wurtzite semiconducting nanostructures / Pu Xian Gao and Zhong Lin Wang -- Bio-inspired nanomaterials / Peng Wang ... [et al.] -- Cryo-temperature stages in nanostructural research / Robert P. Apkarian.
0
Mode of access: World Wide Web.
Scanning microscopy for nanotechnology : techniques and applications
OhioLINK electronic book center
SpringerLink
Nanotechnology.
Scanning electron microscopy.
Wang, Zhong Lin.
Zhou, Weili.
20101207083351.0
مطالعه متن کتاب [Book]
Y
