عنوان
پدید آورنده
موضوع
رده
TA645 .I588 2005
TA645
.
I588
2005
کتابخانه
محل استقرار
3908451299 (pbk.)
9783908451297 (pbk.)
dltt
Safety and structural integrity 2006 /
[Book]
edited by Young-Jin Kim
Uetikon, Zurich :
Trans Tech Publications Ltd.,
c2007
ix, 300 p. :
ill. ;
25 cm
Diffusion and defect data.
Pt. B,
Solid state phenomena ;
v. 120
Includes bibliographical references and index
Structural analysis (Engineering), Congresses
Structural engineering-- Research, Congresses
Structural stability, Congresses
624
.
171
22
TA645
TA645
.
I588
2005
.
I588
2005
Kim, Young-Jin,1950-
International Symposium on Safety and Structural Integrity(2005 :, Cheju-do, Korea)
20080627113012.0
مطالعه متن کتاب [Book]
Y
