عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
1615030085
9781615030088
dltt
ISTFA 2009 :
[Book]
conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International
Materials Park, Ohio :
Asm International,
c2009
355 p. :
ill. ;
28 cm. + 1 CD-ROM (4 3/4 in.)
Includes bibliographical references and index
Conference proceedings from the 35th International Symposium for Testing and Failure Analysis
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
621
.
381
International Symposium for Testing and Failure Analysis(35th :2009 :, San Jose, Calif.)
ASM International
Electronic Device Failure Analysis Society
20110503123808.0
مطالعه متن کتاب [Book]
Y
