عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
087170823X
dltt
ISTFA 2005 :
[Book]
proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International
Materials Park, Ohio :
ASM International,
c2005
xviii, 523 p. :
ill. :
28 cm. +
CD-ROM
Includes bibliographical references and index
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
International Symposium for Testing and Failure Analysis(31st :2005 :, San Jose, CA.)
ASM International
Electronic Device Failure Analysis Society
20060213090449.0
مطالعه متن کتاب [Book]
Y
