conference proceedings from the 30th International Symposium for Testing and Failure Analysis, 14-18 November 2004
Materials Park, Ohio :
ASM International,
2004
1 computer optical disc :
col. ;
4 3/4 in
Electronic data
Title from disc label
Includes bibliographical references and index
Contains complete text of the conference proceedings
System requirements (Macintosh): Power PC processor; 64MB of RAM; Mac OS 8.6, 9.0.4, 9.1 or Mac OS X; 24MB of available hard-disk space, additional 70MB of hard-disk space for Asian fonts (optional); CD-ROM drive
System requirements (Windows): IBM PC or compatible with Pentium class processor; 64MB of RAM; Windows 98 2nd edition, Windows Millennium edition, Windows NT 4.0 with Service Pack 5 or 6 (Service Pack 6 recommended), Windows 2000, Windows XP Professional or Home Edition; 30MB of available hard disk space (an additional 60MB is needed temporarily during installation), additional 70MB of hard-disk space for Asian fonts (optional); CD-ROM drive
Proceedings of the 30th International Symposium for Testing and Failure Analysis, 14-18 November 2004
Conference proceedings from the 30th International Symposium for Testing and Failure Analysis
Electronic apparatus and appliances-- Testing, Congresses
Electronics-- Materials-- Testing, Congresses
TK7871
.
I48
2004
International Symposium for Testing and Failure Analysis(30th :2004 :, Worcester, Mass.)