conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
organized by Electronic Device Failure Analysis Society, ASM International.
1 online resource (560 pages) :
color illustrations, photographs
Includes index.
ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA.
9781627080743
Electronic apparatus and appliances-- Testing, Congresses.
Electronics-- Materials-- Testing, Congresses.
International Symposium for Testing and Failure Analysis(40th :2014 :, Houston, Tex.)