conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Materials Park, Ohio :
ASM International,
2012.
xxi, 620 p. :
ill. (some col.)
Includes bibliographical references and index.
Access may be limited to ebrary affiliated libraries.
Electronic apparatus and appliances-- Testing, Congresses.
Electronics-- Materials-- Testing, Congresses.
TK7801
.
I58
2012eb
International Symposium for Testing and Failure Analysis(38th :2012 :, Phoenix Convention Center)