عنوان
پدید آورنده
موضوع
رده
TK7871 .I58 2011eb
TK7871
.
I58
2011eb
کتابخانه
محل استقرار
0615038263
9781615038268
9781615038503 (e-book)
dltt
ISTFA 2011
[Book]
conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
Materials Park, Ohio :
ASM International,
2011.
xix, 456 p. :
col. ill.
Includes bibliographical references and index.
Access may be limited to ebrary affiliated libraries.
Electronic apparatus and appliances-- Testing, Congresses.
Electronics-- Materials-- Testing, Congresses.
TK7871
.
I58
2011eb
International Symposium for Testing and Failure Analysis(37th :2011 :, San Jose, Calif.)
ASM International.
ebrary, Inc.
Electronic Device Failure Analysis Society.
مطالعه متن کتاب [Book]
Y
