عنوان
پدید آورنده
موضوع
رده
TK7871 .I87 2010eb
TK7871
.
I87
2010eb
کتابخانه
محل استقرار
0615030416
9781615030415
9781615037278 (e-book)
dltt
ISTFA 2010
[Book]
conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International.
Materials Park, Ohio :
ASM International,
2010.
xix, 464 p. :
ill. (some col.)
Includes bibliographical references and index.
Access may be limited to ebrary affiliated libraries.
Electronic apparatus and appliances-- Testing, Congresses.
Electronics-- Materials-- Testing, Congresses.
TK7871
.
I87
2010eb
International Symposium for Testing and Failure Analysis(36th :2010 :, Dallas, Tex.)
ASM International.
ebrary, Inc.
Electronic Device Failure Analysis Society.
مطالعه متن کتاب [Book]
Y
