عنوان

Desorption mass spectrometry :

0841209421

9780841209428

b428452

Desorption mass spectrometry :

[Book]

are SIMS and FAB the same? : developed from a symposium sponsored by 3M, the National Science Foundation Midwest Center for Mass Spectrometry at the University of Nebraska--Lincoln, and the National Science Foundation Regional Facility for Surface Analysis at the University of Minnesota, St. Paul, Minnesota, Oct. 7-10, 1984 /

Philip A. Lyon, editor.

Washington, D.C. :

American Chemical Society,

1985.

viii, 248 pages :

illustrations ;

24 cm.

ACS symposium series,

291

0097-6156 ;

Includes bibliographical references and indexes.

Molecular secondary ion mass spectrometry / Steven J. Pachuta and R. Graham Cooks -- Particle bombardment as viewed by molecular dynamics / Barbara J. Garrison -- Role of intermolecular interactions in the desorption of molecular ions from surfaces / Ronald D. Macfarlane -- Processes of laser-induced ion formation in mass spectrometry / F. Hillenkamp, M. Karas, and J. Rosmarinowsky -- Angle-resolved secondary ion mass spectrometry / Nicholas Winograd -- Secondary ion mass spectrometer design considerations for organic and inorganic analysis / C.W. Magee -- Liquid metal ion sources / Douglas F. Barofsky -- Fast atom bombardment mass spectrometry technique and ion guns / Julius Perel -- Fast atom bombardment secondary ion mass spectrometry surface analysis / J.A. Leys -- Secondary ion mass spectrometry : a multidimensional technique / Richard J. Colton, David A. Kidwell, George O. Ramseyer, and Mark M. Ross -- Fast atom bombardment combined with tandem mass spectrometry for the study of collisionally induced remote charge site decompositions / Nancy J. Jensen, Kenneth B. Tomer, Michael L. Gross, and Philip A. Lyon -- Analysis of reactions in aqueous solution using fast atom bombardment mass spectrometry / Richard M. Caprioli -- Applications of fast atom bombardment in bioorganic chemistry / Dudley H. Williams -- Use of secondary ion mass spectrometry to study surface chemistry of adhesive bonding materials / W.L. Baun.

0

Desorption mass spectrometry.

Field desorption mass spectrometry, Congresses.

Secondary ion mass spectrometry, Congresses.

Lyon, Philip A.,1945-

American Chemical Society.

20140203034519.0

[Book]

Y