عنوان

System-on-chip test architectures

پدید آورنده

edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba

موضوع

Integrated circuits-- Very large scale integration-- Design,Integrated circuits-- Very large scale integration-- Testing,Systems on a chip-- Testing

رده

TK7895
.
E42

S978

2008

کتابخانه

کتابخانه مطالعات اسلامی به زبان های اروپایی

محل استقرار

استان: قم ـ شهر: قم

تماس با کتابخانه : 32910706-025

012373973X

9780123739735

b425487

System-on-chip test architectures

[Book]

nanometer design for testability /

edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba

Boston :

Morgan Kaufmann Publishers,

c2008

xxxvi, 856 p. :

ill. ;

25 cm

The Morgan Kaufmann series in systems on silicon

Includes bibliographical references and index

Available to subscribing institutions.

Safari Books Online

CL0500000047

9780080556802

Integrated circuits-- Very large scale integration-- Design

Integrated circuits-- Very large scale integration-- Testing

Systems on a chip-- Testing

TK7895

E42

S978

2008

Stroud, Charles E

Touba, Nur A

Wang, Laung-Terng

Ohio Library and Information Network

20090901205851.0

[Book]

عنوان System-on-chip test architectures

پدید آورنده edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba

موضوع Integrated circuits-- Very large scale integration-- Design,Integrated circuits-- Very large scale integration-- Testing,Systems on a chip-- Testing

رده TK7895.E42 S978 2008

کتابخانه کتابخانه مطالعات اسلامی به زبان های اروپایی