عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
0852969015
b417057
VLSI testing :
[Book]
digital and mixed analogue/digital techniques /
Stanley L. Hurst
London :
Institution of Electrical Engineers,
c1998
xx, 532 p. :
ill. ;
24 cm
IEE circuits, devices and systems series ;
9
Includes bibliographical references and index
Integrated circuits-- Very large scale integration-- Testing
Hurst, S. L., (Stanley Leonard)
19980701103035.0
مطالعه متن کتاب [Book]
Y
