عنوان

Electronics reliability and measurement technology :

081551171X :

b415798

Electronics reliability and measurement technology :

[Book]

nondestructive evaluation /

edited by Joseph S. Heyman

Park Ridge, N.J., U.S.A. :

Noyes Data Corp.,

c1988

8811

xii, 128 p. :

ill. ;

26 cm

"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Preface

Includes bibliographical references and index

Integrated circuits-- Reliability-- Congresses

Integrated circuits-- Testing-- Congresses

Nondestructive testing-- Congresses

621

381/028/7

TK7874

E486

1988

Heyman, Joseph S

Electronics Reliability and Measurement Technology Workshop(1986 :, NASA Langley Research Center)

19900329000000.0

[Book]