conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
sponsored by Electronic Device Failure Analysis Society.
1 online resource (633 pages) :
color illustrations, charts, photographs, graphs, tables
Includes bibliographical references at the end of each chapters and index.
ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA.
9781627080224
Electronic apparatus and appliances-- Testing, Congresses.
Electronics-- Materials-- Testing, Congresses.
International Symposium for Testing and Failure Analysis(39th :2013 :, San Jose, California)