عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
1613442866
9781613442869
b405360
RF and microwave modeling and measurement techniques for field effect transistors
[Book]
Jianjun Gao.
Raleigh, NC :
SciTech Pub.,
c2010.
x, 339 p. :
ill. ;
24 cm.
Includes bibliographical references and index.
Includes interactive index.
Representation of Microwave Two-Port Network -- Microwave and RF Measurement Techniques -- FET Small Signal Modeling and Parameter Extraction -- FET Nonlinear Modeling and Parameter Extraction -- Microwave Noise Modeling and Parameter Extraction Technique for FETs -- Artificial Neural Network Modeling Technique for FET
0
"This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success.
The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based."--pub. desc.
9781891121890
Compound semiconductors-- Mathematical models.
Compound semiconductors-- Testing.
Field-effect transistors-- Mathematical models.
Field-effect transistors-- Testing.
Microwave measurements.
Radio measurements.
Gao, Jianjun,1968-
Knovel (Firm)
20111207090607.0
مطالعه متن کتاب [Book]
Y
