عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
0444601473
0720417570
9780444601476
9780720417579
0444104623
9780444104625
b401579
Computed electron micrographs and defect identification
[Book]
By A.K. Head, P. Humble, L.M. Clarebrough, a.o.
Amsterdam :
North-Holland Pub. Co.,
1973.
1 online resource (x, 400 pages :
illustrations).
Defects in crystalline solids,
v. 7
Includes bibliographical references (p. [387]-389).
Computed electron micrographs and defect identification.
Electron micrographs and defect identification
Electron microscopy-- Data processing.
Metals-- Defects-- Data processing.
cristallographie.
diffraction.
dislocation.
identification défaut.
physique.
Cristallographie-- Informatique.
Cristaux-- Défauts.
Électrons-- Diffraction.
Computersimulaties.
Electron microscopy-- Data processing.
Elektronendiffractie.
Elektronenmicroscopie.
Metall.
Metals-- Defects-- Data processing.
Mikrostruktur.
Roosterfouten.
SCIENCE-- Physics-- Crystallography.
Vastestoffysica.
Head, A. K.
ScienceDirect (Online service)
20140731102927.0
pn
مطالعه متن کتاب [Book]
Y
