selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China /
edited by Prasad Yarlagadda and Yun-Hae Kim.
1 online resource (2012 pages) :
illustrations (some color), graphs, tables.
Applied Mechanics and Materials,
Volume 568-570
1662-7482 ;
Includes bibliographical references at the end of each chapters and indexes.
Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China.
1662-7482
9783038351382
ICMIA 2014
Detectors, Congresses.
Measurement, Congresses.
Measuring instruments, Congresses.
Kim, Yun-Hae
Yarlagadda, Prasad
International Conference on Measurement, Instrumentation and Automation(3rd :2014 :, Shanghai, China)