عنوان
پدید آورنده
موضوع
رده
TA 460 .S9395 1966
TA
460
.
S9395
1966
کتابخانه
محل استقرار
electronic
Behavior of materials at cryogenic temperatures; a symposium presented at the sixty-eighth annual meeting, American Society for Testing and Materials, Lafayette, Ind., June 13-18, 1965
Philadelphia
American Society for Testing and Materials
1966
148 p. illus. 23 cm.
ASTM special technical publicationno. 783
Sponsored by the Division of Materials Sciences, American Society for Testing and Materials
Includes bibliographies
Effect of low temperatures on ، Metals
TA
460
.
S9395
1966
AU
CO American Society for Testing and Materials
CO American Society for Testing and Materials.Division of Materials Sciences
TI
SE
Symposium on the Behavior of Materials at Cryogenic Temperatures, 1965. ]from old catalog[Lafayette, Ind.,
