عنوان
پدید آورنده
موضوع
رده
TK 6552.5 .W35 2017
TK
6552
.
5
.
W35
2017
کتابخانه
محل استقرار
electronic
author
Wallis, T. Mitch
4791-
Measurement techniques for radio frequency nanoelectronics
Cambridge University Press
2017
The Cambridge RF and microwave engineering series
Includes bibliographical references and index
T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder
Measurement ، Radio frequency
، Nanoelectronics
، Radio frequency microelectromechanical systems
TK
6552
.
5
.
W35
2017
AU
AU Kabo۸s, P.)Pavel( author
TI
SE
