عنوان
پدید آورنده
موضوع
رده
TA 418.9 .T45 S94 1997
TA
418
.
9
.
T45
S94
1997
کتابخانه
محل استقرار
75334
English
Recent developments in thin film research :epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction : proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
Amsterdam ; New York
Elsevier
c1997
x, 279, v, 223 p. :ill. ;29 cm
European Materials Research Society symposia proceedings
69
"Reprinted from Thin solid films, vol. 318 )1-2( and Thin solid films, vol. 319 )1-2("--T.p. verso.
Includes bibliographical references and indexes.
]G. Ritter ... et al., editors[
، Thin films
، Epitaxy
، Nanostructured materials
، Electron microscopy
Diffraction ، X-rays
TA
418
.
9
.
T45
S94
1997
AU
AU .G ,rettiR ed.
CO Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures)7991 :Strasbourg, France(
TI
SE
Symposium B on Epitaxial Thin Film Growth and Nanostructures)1997 : Strasbourg, France(
که فیزیه دانشکدانابخکت
