عنوان
پدید آورنده
موضوع
رده
QC 415 .F88 1989
QC
415
.
F88
1989
کتابخانه
محل استقرار
BL18449
Fringe pattern analysis for optical metrology theory ,algorithms,and applications
Graeme T. Reid, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University.
Bellingham, Wash., USA
SPIE
2014
327
Diffraction patterns
Interferometry
Image processing
QC
415
.
F88
1989
"Papers presented at the First SPIE Conference on Fringe Pattern Analysis"--Introd
Includes bibliographical references an d index
AU
CO
CO
SE
Reid, Graeme T
