65050
Schroder, Dieter K.
Semiconductor material and device characterization
New York
Wiley
c1998
xxiv, 760 p. : ill
"A Wiley-Interscience publication"
Includes bibliographical references and index
Dieter K. Schroder
2nd ed
، Semiconductors
Testing ، Semiconductors
QC
611
.
S335
1998
AU
TI
CL
