16603
VLSI testing
Amsterdam; New York
New York, N.Y., U.S.A.
North-Holland Pub. Co.
Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co.
1986
ix, 275p.:ill
Advances on CAD for VLSI; v.5
Includes bibliographies
edited by T.W. Williams
Very large scale integration - Testing ، Integrated circuits
TK
7874
.
V5666
1986
TI
AU Williams, T.W. 1943-
SE
CL
