20942
21410
Hurst, Stanley L.
VLSI testing: digital and mixed analogue/ digital techniques
London
The Institution of Electrical Engineers
1998
xx, 532p.: ill
IEE circuits, devices and systems series; 9
Includes bibliographical references and index
Stanley L. Hurst
Very large scale integration - Testing ، Integrated circuits
TK
7874
.
H87
1998
AU
TI
SE
CL
CL
