عنوان
پدید آورنده
موضوع
رده
TA 410 .D48 1996
TA
410
.
D48
1996
کتابخانه
محل استقرار
electronic
Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA
Columbus, Ohio : ASM International
International Metallographic Society ; Materials Park, Ohio :
1996
vii, 125 p. : ill. ; 29 cm
Includes bibliographical references
edited by George F. Vander Voort, John J. Friel
Congresses ، Materials - Testing
Congresses ، Nondestructive testing
Congresses ، Materials - Microscopy
Congresses ، Metallography
TA
410
.
D48
1996
TI
AU Vander Voort, George F
AU Friel, John J
CO International Metallographic Society.Technical Meeting)82th :5991 :Albuquerque, N.M.(
