عنوان
پدید آورنده
موضوع
رده
QC 611 .S335 2006
QC
611
.
S335
2006
کتابخانه
محل استقرار
4240
Schroder, Dieter K.
Semiconductor material and device characterization
]Piscataway, NJ[
IEEE Press ; Hoboken, N.J. =
xv, 779 p. ill. 25 cm.50,y50,toolbar0,location0,directories0,status0,scrollbars"aut=
0A=
ISBN: 04717390659780471739
"Wiley-Interscience."
Includes bibliographical references and index.
ng
Publisher description http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html
Table of contents only http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html
Contributor biographical information http://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html
Dieter K. Schroder
3rd ed.
، Semiconductors
، Semiconductors- Testing
QC
611
.
S335
2006
AU
TI
1
