عنوان
پدید آورنده
موضوع
رده
TK7871.95
TK7871
.
95
کتابخانه
محل استقرار
2147
Franco, Jacopo
author
Reliability of high mobility SiGe channel MOSFETs for future CMOS applications
1 online resource )xix, 187 pages( : illustrations
Springer Series in Advanced Microelectronics,7341-7830 ;volume 74
Includes bibliographical references
Degradation mechanisms -- Techniques and devices -- Negative Bias Temperature Instability in )Si(Ge pMOSFETs -- Negative Bias Temperature Instability in nanoscale devices -- Channel Hot Carriers and other reliability mechanisms -- Conclusions and perspectives
Reliability ، Metal oxide semiconductor field-effect transistors
Reliability ، Metal oxide semiconductors, Complementary
، Physics
، Semiconductors
، Circuits and Systems
، Optical and Electronic Materials
، Electronic Circuits and Devices
621
.
3815284
TK7871
.
95
AU
Jacopo Franco, Ben Kaczer, Guido Groeseneken
AU neB ,rezcaK author
AU odiuG ,nekeneseorG author
TI
SE
SE Springer series in advanced microelectronics ;
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