عنوان
پدید آورنده
موضوع
رده
TK 7875 .H378 2011
TK
7875
.
H378
2011
کتابخانه
محل استقرار
1968
Hartzell, Allyson L.
MEMS reliability
New York
Springer
c2011
xiii, 291 p. , ill. , 25 cm.
MEMS reference shelf
Includes bibliographical references and index.
Lifetime Prediction -- Failure Modes and Mechanisms: Failure Modes and Mechanisms in MEMS -- In-Use Failures -- Root Cause and Failure Analysis -- Testing and Standards for Qualification -- Continuous Improvement: Tools and Techniques for Reliability Improvement.
، Microelectromechanical systems, Reliability
621
.
381
TK
7875
.
H378
2011
AU
Allyson L. Hartzell, Mark G. da Silva, Herbert R. Shea ; Foreword by Stephen D. Senturia
AU .G kraM ,avliS aD
AU .R trebreH ,aehS
TI
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