عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
6758
6871
Meehan, Michael D.
Yield and reliability in microwave circuit and system design
Boston
Artech House
c1993
xviii, 276 p. :ill. ;24 cm
Artech House microwave library
Includes bibliographical references and index.
، Microwave integrated circuits- Design and construction- Statistical methods
، Engineering design- Statistical methods
، Computer- aided design
621
.
381/32
TK
7876
.
M3892
1993
AU
Michael D. Meehan and John Purviance
AU .nhoJ ,ecnaivruP
TI
هت شبکل و مدیریه کنترپژوهشکد
