عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
10474/1
Chakradhar, Srimat T.
Neural models and algorithms for digital testing
Boston
Kluwer Academic Publishers
c1991
xii, 184 p. :ill. ;25 cm
Includes bibliographical references and index.
، Logic circuits- Testing
، Automatic checkout equipment
، Digital integrated circuits- Testing- Data processing
621
.
39/5
TK
7868
.
L6C44
1991
AU
by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell
AU -3491 ,.D inawhsiV ,lawargA
AU -0591 ,(eeL leahciM) .L leahciM ,llenhsuB
SE Kluwer international series in engineering and computer science ; SECS 140.
AU Kluwer international series in engineering and computer science. ۴p VLSI, computer architecture, and digital signal processing. .ecneics retupmoc dna gnireenigne ni seires lanoitanretni rewulK:seireS VLSI, computer architecture, and digital signal processing.
TI
