عنوان
پدید آورنده
موضوع
رده
کتابخانه
محل استقرار
4637
Singh, Narinder, 6591-
An artificial intelligence approach to test generation
Boston
Kluwer Academic Publishers
c1987
x, 193 p. :ill. ;25 cm
The Kluwer international series in engineering and computer science ; SECS 91
Bibliography: p. ]189[- 193.
، Integrated circuits- Very large scale integration- Testing- Data processing
، Expert systems )Computer science(
، Artificial intelligence
621
.
395
TK
7874
.
S533
1987
AU
by Narinder Singh
TI
