عنوان
پدید آورنده
موضوع
رده
TK 7895 .E42 .S978 2008
TK
7895
.
E42
.
S978
2008
کتابخانه
محل استقرار
144887
145012
بهار۷۸
English
)50-91(
System-on-chip test architectures: nanometer design for testability
Amsterdam; Boston
Morgan Kaufmann Publishers
2008
xxxvi, 856 p.: ill.; 25 cm
The Morgan Kaufmann series in systems on silicon
Includes bibliographical references and index
Testing ، Systems on a chip
Testing ، Integrated circuits-- Very large scale integration
، Integrated circuits-- Very large scale integration-- Design
TK
7895
.
E42
.
S978
2008
TI
edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
AU gnreT-gnuaL ,gnaW
AU E selrahC ,duortS
AU A ruN ,abuoT
SE
129
05
