عنوان
پدید آورنده
موضوع
رده
TK 7874 .I176 2000
TK
7874
.
I176
2000
کتابخانه
محل استقرار
128108
زمستان۰۸
English
)91(
Proceedings: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems: 25-27 Oct. 2000, Yamanashi, Japan
Los Alamitos
IEEE Computer Society Press
2000
xii, 422 p.: ill.; 23 cm
Includes bibliographical references and author index
Congresses ، Integrated circuits-- Very large scale integration-- Design and construction
Congresses ، Fault-tolerant computing
TK
7874
.
I176
2000
AU
sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee
CO IEEE Computer Society
CO IEEE Computer Society. Fault-Tolerant Computing Technical Committee
CO IEEE Computer Society. Test Technology Technical Committee
TI
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems )2000: Yamanashi, Japan(
129
