عنوان
پدید آورنده
موضوع
رده
TK 7874 .I176 1999
TK
7874
.
I176
1999
کتابخانه
محل استقرار
124961
بهار۰۸
English
)91(
Proceedings: 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems: November 1-3, 1999, Albuquerque, New Mexico
Los Alamitos
IEEE Computer Society Press
1999
xiii, 405 p.: ill.; 23 cm
"IEEE Computer Society Press Order Number PR00325"-verso of T.p
Includes bibliographical references and author index
Congresses ، Integrated circuits-- Very large scale integration-- Design and construction
Congresses ، Fault-tolerant computing
TK
7874
.
I176
1999
AU
sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
CO IEEE Computer Society
CO IEEE Computer Society. Fault-Tolerant Computing Technical Committee
CO IEEE Computer Society. Test Technology Technical Committee
TI
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems )1999: Albuquerque, N. M.(
129
