عنوان

Reliability, yield, and stress burn-in: a unified approach for microelectronics systems manufacturing & software development

117255

بها‌ر۸۷

English

)50(

Kuo, Way

1951-

Reliability, yield, and stress burn-in: a unified approach for microelectronics systems manufacturing & software development

Boston

Kluwer Academic Publishers

1998

xxvi, 394 p.: ill.; 24 cm

Includes bibliographical references and index

، Integrated circuits-- Design and construction-- Reliability

، Microelectronics-- Reliability

، Computer software-- Development-- Reliability

، Semiconductors-- Computer programs-- Reliability

7874

K867

1998

by Way Kuo, Wei-Ting Kary Chien, Taeho Kim

AU yraK gniT-ieW ,neihC 1965-

AU oheaT ,miK 1960-