عنوان
پدید آورنده
موضوع
رده
TK 7874 .I474
TK
7874
.
I474
کتابخانه
محل استقرار
109770
114766
115641
پائیز۷۷
English
)50-91(
International Test Conference
Proceedings
Silver Spring, Md.
IEEE Computer Society Press
1983-
v. : ill. ; 28 cm
Annual
Some conferences also have distinctive titles
Published: Altoona, PA: International Test Conference, )1995-(
Sponsored by the IEEE Computer Society, Test Technology Committee, and the IEEE, Philadelphia Section
Cover title: IEEE ... Test Conference 1983-1986
Cover title: IEEE International Test Conference 1987-
Continues:International Test Conference. Digest of papers, ISSN 0743-1686
ISSN 1089-3539= Proceedings- International Test Conference
، Computer storage devices-- Congresses
، Integrated circuits-- Testing-- Congresses
، Semiconductor storage devices-- Testing-- Congresses
TK
7874
.
I474
AU
International Test Conference
CO IEEE Computer Society. Test Technology Committee
CO Institute of Electrical and Electronics Engineers. Philadelphia Section
TI
TI IEEE... Test Conference
TI IEEE International Test Conference
129
05
129
